<p>The Tektronix AFG31000 Series is a high-performance AFG with built-in arbitrary waveform generation, real-time waveform monitoring, and the largest touchscreen on the market. Providing advanced waveform generation and programming capabilities, waveform verification, and a modern touch-screen interface, the new AFG31000 is sure to delight and simplify the job of every researcher and engineer.</p>
Key performance specifications
- 1 or 2 channel models
- Output amplitude range 1 mVP-P to 10`VP-P into 50`Ω loads
- Basic (AFG) mode:
- 25 MHz, 50 MHz, 100 MHz, 150 MHz, or 250 MHz sine waveforms
- 250 MSa/s, 1 GSa/s or 2 GSa/s sample rates
- 14-bit vertical resolution
- Built-in waveforms include sine, square, ramp, pulse, noise, and other frequently used waveforms
- Sweep, Burst, and Modulation modes (AM, FM, PM, FSK, and PWM)
- Advanced (Sequence) mode:
- Continuous mode (optional Sequence, Triggered and Gated modes)
- 16 Mpts arbitrary waveform memory on each channel (128 Mpts optional)
- Up to 256 steps in sequence mode with loop, jump and wait events
- Variable sampling clock 1 µSa/s to 2 GSa/s
Key features
- Patented InstaView™ technology enables engineers to see the actual waveform at the Device Under Test (DUT) in real time, without the need of an oscilloscope and probe, eliminating the uncertainty caused by mismatched impedance
- Sequencing option adds the ability to program long, complex waveforms with up to 256 steps
- The 9-inch capacitive touch screen works like a smart phone and has short-cuts to frequently used settings
- Built-in ArbBuilder lets you create and edit arbitrary waveforms on the instrument, eliminating the need to connect to a PC
- Outputs are protected from over voltage and current to minimize potential instrument damage
- Built-in Double Pulse Test application to generate voltage pulses with varying pulse widths onto the DUTs
Applications
- Advanced research
- Clock and system synchronization
- Replication of real world signals
- Component and circuit characterization and validation
- Embedded circuit design and test
- General purpose signal generation
- Double pulse test
